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Non-destructive testing : proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam, The Netherlands, April 23-28, 1989

フォーマット:
図書
責任表示:
edited by J. Boogaard and G.M. van Dijk
出版情報:
Amsterdam ; New York : Elsevier, 1989
形態:
2 v. (li, 1900 p.) : ill. ; 25 cm
著者名:
書誌ID:
BA07603788  CiNiibooks
ISBN:
9780444874504 [044487450X] (v. 1)  CiNii Books  Webcat Plus  Google Books
9780444874504 [044487450X] (v. 2)  CiNii Books  Webcat Plus  Google Books
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